Wednesday, May 20, 2009

Is SATS revenue declining or relocating?

What’s that you say? The SATS sector is set for further declines? Really? Or is that yet another negative perspective being expressed by the trade press? Ok, one publication’s headline reporting Gartner’s latest findings grabbed my attention, while I experienced that “oh no here we go again” feeling in the pit of my stomach. Further reading on other industry sites unearthed a more balanced picture. Yes – numbers are down due to the global economy. Nothing earth shattering there. But the solid numbers reported past revenue from 2008 backwards, and anything going forward is purely speculative.

Let’s talk about what’s really happening. Although the SATS sector reported losses last year, they still outpaced the overall semiconductor industry. In fact, several of the OSATS providers – STATS ChipPAC, Unisem, and Powertech all reported growth over 2007. The expected 40% drop in back-end semiconductor manufacturing capacity is reportedly expected at IDMS not the OSATS providers. That number has more to do with IDMS and OEMS adopting an outsource model and shifting the work to packaging houses. As a result, Gartner predicts a 60% capacity increase for the OSATS in the same time frame. In fact, ASE recently reported being awarded a sizeable contract by Intel. One big enough, in fact, that it is likely to boost ASE’s revenues past the expected level. The contract is reportedly due to Intel’s closing of in-house packaging and test facilities.

According to an article I read in Taiwan Economic News, other IDMS such as NXP Semiconductor, Renesas, and Toshiba are expected to follow suit; and other OSATS will benefit. So rather than an overall loss in revenue wouldn’t this be more appropriately termed a shift in revenue? And don’t all parties ultimately benefit as resources are conserved in one place as they are expanded in others? I think they call this restructuring, and at the end of the day, the industry as a whole might just benefit.

So how does this relate to 3D technologies? Clearly, OSATS play an integral part in market adoption of 3D IC integration technologies. I suggest that volume production of 3D WLP and 3D IC stacking using TSVs could be the missing variable to tip the scales in the favor of OSATS who invest in those production capabilities. When numbers are reported next year, will the companies who took on the challenge be the ones reporting growth? That’s what I want to know. – F.v.T.

Monday, May 18, 2009

Can cost-sharing accelerate 3D IC commercialization?

I’ve been talking a lot about the collaborative efforts in the form of open and closed consortia and joint development agreements that seem to be carrying 3D IC integration forward to market adoption. Another approach is a multi-project wafer program, in which participants cost-share to build multiple device prototypes on a single wafer. The intention is to bring the resulting prototypes to commercialization more quickly and at a lower cost to each member than if they were developed individually.

One such program is Tezzaron Semiconductor’s multi-project wafer program, first reported a few months back on Phil Garrou’s 3D blog, Perspectives from the Leading Edge. According to Garrou’s post, the project would allow up to 10 participants to buy a share of wafer real estate for the purpose of developing prototype 3D IC logic devices. The intention was for each participant to design its own 3D logic device, which would be built in Tezzaron’s proprietary FaStack process. Each logic device would then be integrated with a Tezzaron 3D DRAM to create a hybrid memory/logic 3D-IC. Hmm, I thought, cool approach. I need to find out more.

Unfortunately, the project went dark,(it was initially sponsored by DARPA, and mum’s the word when government agencies are involved.) However, the embargo has lifted, and last week I had a lengthy chat with Gretchen Patti, of Tezzaron Semiconductor. While she couldn’t reveal details of specific devices being tested in 3D by participants, she did say they primarily fell into one of two categories; processors and sensors. For the non-techies among us (like me), Patti offered a simple description of the process.



Figure 1 illustrates how two levels of logic are being built on one wafer. Suppose that the two red squares belong to a participant prototyping a processor, the two yellow squares belong to a participant prototyping a sensor technology, etc. The processor is designed with two layers of circuitry. One layer is built in the red square on Side 1, the other on Side 2. Similarly, the sensor is designed with two layers of circuitry that are built in the two yellow squares. Now we build a whole bunch of identical wafers. Each wafer is stacked face-to-face on an identical wafer. In this way, the sensor dies line up, and the processors line up. When the wafers are bonded, the sensor’s two layers of circuitry become a single circuit, and so do the processor layers. The final project wafer consists of different logic devices, each designed by a different participant.

Next, logic devices are then stacked on a Tezzaron 3D DRAM wafer, which was also created as a wafer-to-wafer stack using tungsten-filled TSV interconnects. The final output is various logic-on-memory devices, assembled in a die-to-wafer process using TSV interconnects (Figure 2). One of the benefits of multiple projects being designed using the same memory wafer is that the logic is then designed to interface with a standard memory, so that although the memory wafer is not customized to each device, it attaches as if it was.



According to Patti, the project has taken on a life of its own, and has grown beyond the original intention to include 19 participants from both the public and private sector, including several universities (U. of Pittsburgh, U. of Michigan, and Johns Hopkins, to name a few.)

“We couldn’t believe the response,” she said. “We didn’t even publicize it.” They ended up with 30 applicants, more than twice as many as they expected. There’s no doubt about it, it’s an attractive alternative for companies who can’t swing their own processing costs, but want to test their product to see if it works in 3D. “People are ready,” notes Patti. I’ll say. Look for more on this as I talk to some of the university participants about specific projects. – F.v.T.

Wednesday, May 13, 2009

3D innovation: prevention or cure?

In his editorial yesterday, Steve DeCollibus, managing editor of Semiconductor Packaging News, offered some food for thought about the concept of the semiconductor industry innovating its way out of this downturn. To illustrate his point, he tracks the evolution of the integrated circuit itself – a technical innovation that took 80 years to complete.The point he makes is this: true innovation takes time, dedication, collaboration, and full participation of everyone from academia and R&D, across the entire supply chain. It’s not something that can be done, as he puts it “on demand.” I couldn’t agree more.

Innovation shouldn’t be seen as the antidote, or cure to the current economic pandemic. Rather, ongoing treatment seems to be much a much more potent measure against the disease. For example, 3D integration technologies have been the innovation flavor-of-the-month since long before the current economic disaster hit. Is it by pure coincidence that those companies who continued to push forward and invest in these technologies are the ones who were more resistant to the downturn virus? I’m talking about start-up companies like Alchimer, Replisaurus and Imbera, who managed to raise venture capital to develop their technologies; and established equipment manufacturers like SUSS MicroTec, Surface Technology Systems, and EV Group, who have all recently reported installs in both research and production settings. According to Steve Dwyer, director of sales, North America, EVG, in the past 3 weeks, EVG has received 6 tool orders for TSV processes in North America alone, 4 of which are headed for production lines, while the other two will go to research settings.

Although it may seem that the “Pollyannas” of the industry (myself included) have been dishing out the “innovate out of the downturn” mantra as a way to bolster morale, it’s not without basis. However, perhaps a more accurate explanation is that during a downturn, there is less time spent manufacturing and shipping product, and more time to focus on innovation. The companies who took advantage of that time seemed to be hit less badly by the downturn, and those who were already innovating and continued on that path were the most resistant to the effects of the downturn. After all as, Benjamin Franklin once said, an ounce of prevention is worth a pound of cure. – F.v.T

Tuesday, May 12, 2009

Semi Standards – a 3D conundrum?

I got into an interesting conversation recently with Steve Dwyer, of EV Group, about the puzzling situation 3D IC integration is posing with regard to existing Semi Standards, and those yet to be established as 3D IC integration processes are developed.

Take, for example, the standard for wafer handling. Dwyer explained that the current standard calls for a process wafer to be returned to the same slot in the FOUP where it came from. But with temporary bonding for thin wafer handling, the input comes from two separate FOUPs, and the output is the two wafers bonded together, so one FOUP winds up with an empty slot, thereby breaking the standard for handling wafers. Clearly, the standard was set based on single wafer processes, and didn’t consider future possibilities of multiple wafers being combined into a single processed wafer.

Additionally, when it comes to establishing standards for 3D IC integration processes, all the different processes being developed — via-first, via-early, and via last; front side approaches vs. back-side approaches; wafer-to-wafer, chip-to-wafer and chip-to-substrate — will need to be considered.

So what’s the hurry? Is the establishment of standards for 3D IC integration critical for market adoption to take place? Would it be better to hold off until the processes shake out and we see what sticks? Consider also that if multiple approaches are adopted, then standards will need to be set to accommodate different options. “Until the industry works out what it wants to do, we need the flexibility,” notes Dwyer.

I posed this question to Sitaram Arkalgud of SEMATECH’s 3D interconnect program, and Rich Brilla, of the College of Nanoscale Science and Engineering (CNSE) at the University at Albany. Brilla noted that in addition to standards focused on equipment and processes, design ground rules are also needed. For example, knowing where alignment marks should be for wafer to wafer and chip to wafer processes is critical. Part of the work being done by SEMATECH at CSNE will help to establish these standards.

“It takes ages for standards to come together. It’s a voyage of discovery,” notes Arkalgud, adding that this work-in-progress approach to standards is still better than having nothing at all. “3D can revolutionize the industry, but needs standards in order to make it happen, otherwise it will delay the adoption of technology,” he said; a sweeping statement perhaps, but his point is well taken. Without standards to bring the technology to high volume, it runs the risk of just being a niche market. – F.v.T.

Monday, May 11, 2009

Another step forward for EDA Tools

I have to admit, I’ve always had difficulty trying to wrap my head around software, especially design tools. So I’ve come to have a deep respect for those individuals charged with the task of designing the design tools themselves. Not only do they need to be able to visualize the end result, they have to work backwards to anticipate the steps required to get there, and then figure out a way to archive that knowledge for later use. In essence, before a design tool can be designed, the methodology of the steps to achieve this must be established. Then, EDA tool designers create a tool based on these established methodologies to be able to automate the design processes for manufacturing.

Current 2D tools have no notion of a 3D hierarchy and thus no way to build IP libraries for 3D. To design 3D ICs, designers had to resort to tricking 2D tools by renaming design layers or creating multiple copies of standard cell libraries. This “design-by-hand” works fine for 2.5D structures like CMOS image sensors and homogenous 3D DRAM memory stacks, but as Lisa McIlrath, of R3Logic, pointed out during the panel discussion at DATE 2009, logic/memory stacks and true heterogeneous integration will need fully functioning 3D design tools.

Understanding the ramifications of this is what makes R3Logic's latest achievement of that much more noteworthy. The company was recently awarded a patent for “methods and systems for computer aided design of 3D integrated circuits”. According to a company statement, the patented invention comprises both the method of defining a 3D technology file that can incorporate one or more 2D wafer technologies corresponding to different tiers in a 3D stack, and that of defining a 3D hierarchical structure for functional blocks within a 3D system. Managing multiple design libraries while properly handling IP blocks that reside on more than one tier is crucial to 3D system design, notes R3Logic, whether at the circuit layout or at the system architecture level.

Achieving this milestone brings th 3D design pioneer another step closer to proving the industry with the tools they’re seeking. I offer my congratulations and look forward to hearing more about it. – F.v.T

Friday, May 8, 2009

June Events in 3D

As May rolls right into June, so do the 3D events; or should I say events in which 3D topics are addressed. Indeed, it seems as if 3D is permeating just about everything. From looking at the programs, it’s clear that organizers are struggling with categorizing presentations to fit under one categorical umbrella. Oftentimes, while there are dedicated tracks, there’s overflow into others. Another thing to note are those presenters who are “doing the circuit” so-to-speak. If you’re fortunate enough to be attending more than one of these events, you can maximize your conference time by being aware of possible re-runs.

June 2-4 IMEC Technology Forum 2009
Celebrating it’s 25th year, IMEC has re-christened the Annual Research Review Meeting (ARRM) to IMEC Technology Forum (ITF). While the event will cover the gamut of IMEC’s work, specific to 3D technologies will be Eric Beyne’s presentation on heterogeneous integration,and how it will require advances in 3D technologies including: through-Si-via connections, ultra-thin die thinning, high density interconnect die stacking and die embedding technologies. Following Beyne’s presentation, Ingrid De Wolf will address metrology, test and reliability challenges brought on not by 3D chip stacking, also for co-integration of MEMS on top of CMOS and other heterogenous configurations.

June 14-17, The Confab, Las Vegas, NV
Of particular interest to those of us following 3D IC integration issues, will be the session at Confab on Tuesday, June 16, 2:15 PM - 3:45PM titled Economic Implications of Test. In light of test complexities brought on by 3D IC integration such as redundancy, KGD issues, built-in self-test and repair, etc., speakers will address the economic scalability of the test roadmap over the next 3 to 5 years, by examining test drivers, test flow simplification, and “Test Lite” philosophy.

June 15-18, EMPC 2009, Rimini, Italy
European Microelectronics and Packaging Conference (EMPC), combines the efforts of IMAPS Europe; IEEE Components, Packaging, and Manufacturing Technology Society (CPMT); and iNEMI into one biannual event. This year’s event is jam-packed with 3D. Of specific interest to me will be Rao Tummala’s tutorial and subsequent keynote, Beyond 3D ICs to 3D Systems. Additionally, each member of the EMC3D consortium will give a presentation as part of its tutorial session on Monday, June 15. On Thursday, two of the advanced packaging sessions will be devoted to 3D packaging, in addition to 3D related presentations scattered throughout the program as they apply to other categories such as Hannes Kostner’s presentation in the flip chip track, Impact of 3D Packaging Technologies on Flip Chip Equipment; Fraunhofer’s contribution: 3-D Packaging Concept for Cost-effective Packaging of MEMS and ASIC on Wafer-level; to name only a few. Trust me, you won’t run out of things to do at this one. Plus who can resist Rimini in June?

June 28-July2 2009 Lithography Workshop, Coeur d’Alene, Idaho
Historically, this even focused on leading-edge lithography. This year, presentations will include advances in 3D architectures and packaging. A panel discussion, moderated by Dan Hutcheson, debating the pros and cons of advanced lithography vs. advanced packaging and 3-D structures (taller vs. smaller) will be held on Wednesday evening, July 1, 2009.

That wraps it up for June, with the Big Kahuna – SEMICON West, right around the corner. No doubt that event will get a post or two all of its own. Stay tuned. – F.v.T

Thursday, May 7, 2009

My Big Fat 3D Obsession

In one of my all-time favorite movies, My Big Fat Greek Wedding, family patriarch, Kosta Portukalo is obsessed with his own culture, “Give me a word, any word, and I will show you how the root of that word is Greek.” I’m starting to feel that way about 3D technologies. Give me a new technology, any technology, and I will show you how it qualifies as a 3D configuration, either at the chip, package or system level.

For example, Yesterday, I interviewed the team at Texas Instruments (Roland Pang, Larry Nye and Matt Stovall) responsible for launching the company’s PicoStar ultra-thin chip package. While this initial device — an ESD/EMI filter that involves a single die, and achieves a low profile by interconnecting to the board via Cu-Ni-Pd pillar bump — is an achievement in and of itself as an ultra-thin package, it doesn’t really make the cut as a 3D configuration. However, the minute I heard “embedded in the PCB to reclaim board space” my 3D antennae perked up. While the first roll-out of package is intended to be board mounted using standard pick-and-place assembly processes, the second generation will be an embedded device with copper pillar bump interconnects, and is assembled a build-up process currently being developed with board manufacturers-who-could-not-be-named. (Imbera or Ibiden perhaps? Just a guess on my part – but I’ll be keeping my ears open). Embedding the device uses the Z-direction to free up board space (reportedly 90% over the standard ESD/EMI leadframe package) for either more functionality or overall reduction in end product.

Then, when Pang and Nye explained how it could be mounted on a "daughter" package to create a more robust ESD/EMI solution than the daughter package alone, I thought, hmmm.... so it can be assembled in a PoP configuration, once again using the Z-direction to reduce form-factor, thereby qualifying it, by my definition anyhow, as a 3D solution at both the package and board levels – so, there you go! – F.v.T