Lisa McIlrath, R3 Logic: design tools for 3D IC are on the way

Mea culpa. I may have jumped to conclusions in yesterday’s post. Although it appears to those developing 3D IC integration processes that the design community hasn’t been heeding the call for the much needed design tools, after talking with Lisa McIlrath of R3 Logic, I realized there’s a lot more to it than that. In fact, the message has been heard, but these things are more convoluted than we think. In fact, it's a bit of a cart-before-the-horse situation. How can design tools be developed until the process technologies, characterization, and paramaters have been determined, and prototypes tested? For that matter, each customer is likely to establish its own design rules.

Consider that 3D IC integration is still a very new field, and that everyone is very much in what McIlrath called “pathfinding mode”; exploring different designs before having the parameters figured out. She said that there’s lots of advance work being done to discover different customer needs. Design tools needed now for CMOS image sensors and soon for stacked memory may not necessarily turn out to be the same ones needed down the road for heterogeneous integration. Unfortunately, it’s still not clear what the winning applications will be.

For large companies, there's not much incentive to invest in development until the picture is clearer and the market is big enough. However the buzz is that Cadence has been some internal development, and and Synopsis and Mentor are sending some of their people to Friday’s 3D Integration Workshop at DATE 2009, in Nice, France. Clearly, the interest is growing.

McIlrath said that although it might be risky and difficult for small companies to set a course on a tool that may not be adopted, it’s also easier for them to be agile as the market shifts and changes. For example, R3 Logic discovered a need by the research community for a layout editor, so they partnered with MicroMagic to develop one. (Tezzaron Semiconductors, pioneers in manufacturing stacked memory with TSVs uses the tool, and has endorsed it.) This week at DATE 2009, McIlrath says R3 Logic will be showcasing a 3D floorplanning tool scheduled for install this summer. Additionally, last month, the company announced a collaboration with ST-Microelectronics and CEA-LETI to develop a full 3D design flow.

McIlrath says that although it’s regrettable that there aren’t more tools out there and available, she doesn’t agree that the lack of design solutions, or test for that matter, is a blocking factor in TSV adoption. “3D integration is going to go ahead with or without any particular player,” she said. “The design tools are coming. Our goal is to find the most appropriate tools to suit the needs of the users.” – F.v.T

DATE 2009 Addresses Design for 3D Integration

It looks as though the call is finally being heard. Those deeply involved in 3D IC Integration using through silicon vias (TSV) as a method of interconnect have been banging these particular drums and sending up smoke signals to the design and test communities for quite some time now with the same message: WE NEED DESIGN SOLUTIONS and WE NEED METHODS FOR TEST.

During the 3D Panel held last month at IMAPS Device Packaging Symposium, panelists and attendees alike speculated about the why’s and wherefores of the logjam for both; but no one could really come up with a concrete answer. While several smaller EDA vendors were acknowledged for having developed tools for 3D IC design (Javelin Design Automation, MicroMagic, and R3 Logic), the question of when “the big guys” (Mentor and Cadence) would jump on board. The collective assumption is that until TSV is closer to market adoption, there’s no real need for the larger design houses to jump into the ring. Test for TSV is still very much an enigma.

Therefore, it was with delight that I reviewed the agenda for Friday’s workshop at DATE 2009, 3D Integration – Technology, Architecture, Design, Automation and Test. Workshop organizers, Yann Gillou, of ST Ericcson, and Erik Jan Marinissen and Geert Van der Plas, both from IMEC; have assembled a line-up for attendees from the design and test communities designed to educate attendees about the critical need for solutions, and to spark interaction between researchers, practitioners, and others interested in 3D IC Integration.

Session 1, moderated by Lisa McIlrath of R3 Logic, kicks off with a keyote addressby Sitaram Arkalgud, of SEMATECH, titled The Promise of Through-Silicon Vias, followed by invited speaker, Riko Radojcic from Qualcomm, who will outline requirements for the design-for-3D environment. The talk will focus on the design environment and EDA tools necessary for what Qualcomm identifies as the ‘Stage 1’ class of products, consisting of a functionally partitioned two-die stack. He will identify three classes of methodologies and associated EDA technologies.

The rest of the day addresses the gamut of issues surrounding design and test, ranging from power integrity issues and bandwidth optimization, to SOC test architecture, test strategies for 3D IC, and much more. In addition to live presentations and 22 poster sessions, the day will conclude with a panel discussion, The Future of 3D Integration From All Angles, moderated by Peter Ramm, of the Fraunhofer Institute. Panelists include Roger Carpenter, Javelin Design Automation; Krishnendu Chakrabarty, Duke University; Paul Siblerud, Semitool; Nicolas Sillon; CEA-LETI; Pascal Urard, ST Microelectronics; and Geert Van der Plas, IMEC.

They may not have the answers yet, but at least they’re getting the message. It’s a start. -- F.v.T